選單
 
item Specification Function Location Person in charge
XRD Rigaku X-ray Diffraction (XRD) is an effective method for identifying the phase present in unknown polycrystalline powders. XRD is an important technique in the manufacture of ceramic materials. It provides phase analysis of materials throughout the manufacturing process, form raw materials to products. C102 Professor , Jeng-Yue Wu
FESEM JSM-6700F(JEOL0) materials research, quality control and failure analysis (surface morphology, composition contrast and elemental analysis).Industries that commonly use this technique include: semi-conductor and electronics, metals, ceramics, minerals, manufacturing, engineering, bio-science, and the motor industry. C102 Professor ,Jeng-Yue Wu
AFM SPA400 (SII, Seiko Instruments Inc.) A type of scanning probe microscopy that maps the topography of an interface by scanning a force sensor over the interface. The main advantages of AFM : (a) it does not require a conducting sample,(b) the low force (10-18 N) applied to the sample by this mode makes it particularly useful for imaging soft samples,(c) it demonstrates a highly lateral resolution of 10 AA and a vertical resolution less than 1 AA. C101 Professor , Wei-Ping Dow
ICP IC-5017-40 Qualitation and Quantification of inorganic elements C302 Professor , Chieh-ming J. Chang
TGA SSC/5200 TG/DTA 220 The TG/DTA is a simultaneous measurement instrument combining TG, which utilizes a horizontal differential type balance beam, with the highly flexible DTA feature. This instrument is used for reaction velocity and acceleration degradation tests, as well as analysis of the water and ash content in samples, and evaluation of decomposition, oxidation and heat resistance of samples. C908 Assistant Professor , Chih-Feng Huang
DSC SSC/5200
DSC 220C
The DSC offers a representative measurement technique of thermal analysis to perform fusion, glass transition, thermal history, crystallization, Curie point, oxidation stability and thermal change. DSC can also be used to cover such needs as specific heat capacity and purity measurements. C908 Assistant Professor , Chih-Feng Huang
BET Micromeritics ASAP 2010 The ASAP 2010 Accelerated Surface Porosimetry Analyzer uses gas sorption techniques for research and quality control applications, such as catalyst, carbon nanotube, silical oxide. Differences in the surface area and porosity of particles within a material can greatly influence its performance characteristics. C101 Professor ,Jih-Mirn Jehng
DLS 90 Plus( Brookhaven) Dynamic Light Scattering provides a fast, simple method for submicron particle sizing. Random intensity fluctuations in scattered laser light arising from the Brownian motion of colloidal particles are analysed to give either a simple mean size and polydispersity (distribution width) or complete distribution data even for multimodal distributions. C909 Professor , Wen-Tung Cheng
FTIR

JASCO
FT/IR-200

Measuring the Infrared Spectra of Functional Group C302

Associate Professor , Hou-Chien Chang

UV/VIS

HITACHI
U-2000

Measuring the concentration of solution in UV/VIS wavelengths C302 Associate Professor , Hou-Chien Chang
LC TSP P1000 Measuring the unknown concentration of specific chemical in a solution by flowing the solution in a packed column under specific liquid mobile phase C302 Associate Professor , Hou-Chien Chang
GC

SHIMADZU
GC-8APT

Measuring the unknown concentration of specific chemical in a solution by vaporing into vapors and flow through a packed column by carrier gas C302 Associate Professor , Hou-Chien Chang
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